Grain Yield Monitoring Compensation for Improved Accuracy
Publication Date: 2016-Mar-11
The IP.com Prior Art Database
Page 01 of 2
Title: Grain Yield Monitoring Compensation for Improved Accuracy
As described below, various compensation factors that are applied to a grain yield monitoring means in order to improve the accuracy for determining net yields are disclosed.
A First Compensation Factor: Grain Hardness
Accuracy of an impact plate grain yield sensor is improved by compensating for grain hardness and its effect on grain imparting force on the yield monitor plate vs deforming the grain. The compensation factor may be measured in situ, be the result of a priori measurement, or a combination. Yield monitor accuracy can be improved by applying a compensation factor to impact plate force data which takes into account the portion of the grain force which goes into deforming the grain vs transferring force to the impact plate.
One example of a grain yield monitoring means with grain hardness compensation may contain, but is not limited to, the following: a processor, a grain force impact sensor, a grain hardness determiner and a data store.
The grain hardness determiner comprises at least one of the following;
(a) An in situ mechanical grain hardness determination means (e.g., a grinder).
(b) An in‐situ optical grain hardness determination means (e.g., IR reflectance).
(c) A database of a priori hardness indexed by crop type and optionally variety.
(d) A database of a priori hardness data indexed as in (c) and modified based on an in situ factor such as landscape position (LSP), topography, raw yield, soil moisture, crop moisture.
The a data store comprises at least one of the following;
(a) A local or remote display.
(b) A remote or local georeferenced database.
A method of measuring grain yield with hardness compensation may comprise the steps of; (100) Start
(200) Retrieve crop type and variety
(300) Read in situ data sensor (400) Retrieve gross compensation factor based on crop type and variety (500) Net yield = (grain impact sensor yield) x (a priori crop type and variety factor) x (in situ data factor) (600) Write the net yield to at least one data store (700) IF NOT done harvesting THEN GOTO STEP (200)
A Second Compensation Factor: Grain Trajectory on an Impact Plate
Accuracy of impact plate grain yield monitors may be improved by taking into account the angle at which grain is hitting the plate on a grain impact sensor. The momentum vector may be used to generate a compensation factor for converting measured plate force to yield or to make machine adjustments to compensate for ...