Minimizing Impacts to an Electronic System by Sensing Electrostatic Build-up Prior to an ESD Event
Publication Date: 2016-Dec-19
The IP.com Prior Art Database
Described is a method for minimizing impacts to an electronic system by sensing electrostatic build-up prior to an ESD event.
Minimizing Impacts to an Electronic System by Sensing Electrostatic Build -up Prior to an ESD Event
Although today's interfaces typically have error correction or a CRC-type mechanism built into
the protocol, an electrostatic discharge is capable of corrupting more data than can be corrected
or detected within specified standards. Data loss within a transmission channel is also possible
with this type of discharge event.
In a typical system design, there is a conductive shield around the electronics to keep
static discharges away from the driver to receiver path. This same "shield" would also aid in
keeping radiated emissions from escaping the system and potentially interfering with other
electronics or even being "snooped" by others. In cases where active interfaces are subject to
potentially large ESD fields and/or discharge.,there is a concern regarding data integrity and/or
loss. In typical system's cable ports, airflow inlets/outlets, etc., are pathways to allow potentially
high voltages to propagate into the interior of the system and perhaps causing an electrical fault.
Hence, much effort is spent inserting additional shield components, bleed resistors, filters, and
the like around areas which might be pathways into the system.
Another design consideration includes the ability to do concurrent maintenance on the
system (repair/replace functions while the system is still operating). The shield, as known, is
opened (compromised) and components possibly at different potentials are replaced within the
system. Even though static dissipation packaging, wrist straps, etc., may be used, there are still
plenty of opportunities to have significant voltage discharges and, hence, the likelihood of
misinterpreted data transfers (errors).
Even if the circuitry is not damaged with the levels of static voltage associated with
charge build-up within an electronic enclosure, the nature of today's interfaces are driving toward
less and l...