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A Bidirectional Low-Noise Electrical Probing Apparatus

IP.com Disclosure Number: IPCOM000249022D
Publication Date: 2017-Jan-26
Document File: 3 page(s) / 328K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a probing device that facilitates monitoring and signal injection for circuits constructed on a rigid planar substrate

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A Bidirectional Low-Noise Electrical Probing Apparatus

The novel contribution is a probing device that facilitates monitoring and signal injection for circuits constructed on a rigid planar substrate.

The probe is comprised of: · A 50-ohm coaxial cable and a plastic compass with metal tips to aid in positioning the signal insertion and

monitoring (Figure 1) · A drafting compass-like device constructed of non-conducting material, containing metallic tips for contacting the

device under test (DUT) (Figure 2) · Coaxial cable, matching in impedance to instrumentation (typically 50 ohms)

The design brings the coaxial cable into the device and connects it to the metallic tips that make contact with the DUT. The coaxial cable should be strain-relieved using modern strain relief techniques.

Some uncoupled length in wiring at the end is required to ease articulation, but is minimized to decrease the noise pickup loop area. Feed-in needs to be length-matched and articulation slack may be coiled to minimize loop area. The device should be constructed of non-conducting material to avoid shorting the DUT and picking up stray noise. The pins may contact any point in a circuit, including but not limited to trace, etch, via, etc.

Figure 1: Coaxial cable

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Figure 2: Device for contacting the DUT

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Figure 3: Device embodiment

The instrument allows the rapid performance of signal injection applications (e.g., voltage regulator compensation sweeps) on a multitude of regulators. For signal inj...