The following operators can be used to better focus your queries.
( ) , AND, OR, NOT, W/#
? ï¿½ single char wildcard, not at start
* ï¿½ multi char wildcard, not at start
"..." ï¿½ literal
(Cat? OR feline) AND NOT dog?
Cat? W/5 behavior
(Cat? OR feline) AND traits
Cat AND charact*
This guide provides a more detailed description of the syntax that is supported along with examples.
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Disclosed is a method of using logical I2C adapters present in Blade Center for System Management Application. The device driver abstracts logical I2C adapters as physical adapters enabling applications to access I2C devices seemlessly whether the devices are present on physical adapter or logical adapters.
Traveling on highways may take some time (not because of the traffic jam but because of the distance between the cities) and during these long hours the driver and/or the passengers have limited choices to pass the time. To entertain the crew, one option would be to be able to get ‘on-demand’ access to audio books...
The versatile Transcoder Rate Adaptation Unit (versaTRAU or VT) for GPRS/EDGE networks has introduced packet backhaul (PB) carriers that have backhaul capacities aggregated over the entire carrier in addition to the existing circuit backhaul (CB) carriers containing a fixed backhaul capacity associated with each of...
In this paper, we consider the problem of carrier selection for GPRS and EDGE networks, where the backhaul bandwidth is aggregated across all data timeslots in a carrier. This is in contrast to a circuit backhaul where the bandwidth is provisioned for each individual data timeslot. To achieve statistical multiplexing...
In this paper, we consider the problem of scheduling for GPRS and EDGE networks, where the backhaul bandwidth is aggregated across all data timeslots in a carrier. This is in contrast to a circuit backhaul where the bandwidth is provisioned for each individual data timeslot. To achieve statistical multiplexing gains,...
The complex of very large-scale integrated circuits contain very large number of logic circuits that require extensive testing. In order to mitigate the complexity of the testing required, scan based designs have been implemented. Generally, the drawback of the scan based design test methodology is encountered...