Browse Prior Art Database

TESTING TEMPERATURE LIMIT CIRCUITS AT ROOM TEMPERATURE

IP.com Disclosure Number: IPCOM000005704D
Original Publication Date: 1988-Oct-01
Included in the Prior Art Database: 2001-Oct-29

Publishing Venue

Motorola

Related People

Authors:
Bill Dunn

Abstract

One of the design aims with SMARTMOS devices is adequate testability of the final encapsulated device. A typical device has an input lead to drive the power output device, two diagnostic leads for interrogation of the functionality of the device, and a load condition lead. Also a fault or status pin is provided to inform the controllingmediumof thestatusof theoutput(figure l).TheinputsareTTLcompatible,and theoutput iscapable of controlling several amps.