TESTER ON A CHIP (TOAC) OR APPARATUS FOR APPLICATION OF TESTS FOR EMBEDDED TEST POINTS
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2001-Nov-05
What are the problems solved by this structure? Consider a production test suite (i.e., a collection of test vectors) for an integrated microprocessor with an asynchronous bus protocol. This test suite assumes the existence of two essential conditions: (1) certain external test points or "pins" which are directly accessible by test equipment, and (2) although it is permissible to vary the time between consecutive bus cycles, once a bus cycle is initiated, it must be executed in real-time to accomplish a satisfactory test.