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TESTER ON A CHIP (TOAC) OR APPARATUS FOR APPLICATION OF TESTS FOR EMBEDDED TEST POINTS

IP.com Disclosure Number: IPCOM000005776D
Original Publication Date: 1989-Aug-01
Included in the Prior Art Database: 2001-Nov-05

Publishing Venue

Motorola

Related People

Authors:
William D. Atwell Jr. William C. Bruce Jr. Grady L. Giles

Abstract

What are the problems solved by this structure? Consider a production test suite (i.e., a collection of test vectors) for an integrated microprocessor with an asynchronous bus protocol. This test suite assumes the existence of two essential conditions: (1) certain external test points or "pins" which are directly accessible by test equipment, and (2) although it is permissible to vary the time between consecutive bus cycles, once a bus cycle is initiated, it must be executed in real-time to accomplish a satisfactory test.