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NEGATIVE TRANSIENT SIGNAL SWITCHING CIRCUIT

IP.com Disclosure Number: IPCOM000005916D
Original Publication Date: 1990-Mar-01
Included in the Prior Art Database: 2001-Nov-15

Publishing Venue

Motorola

Related People

Authors:
Wayne Bates

Abstract

When testing the durability of electronic products under conditions of severe electrical stress, it is often necessary to inject large negative transient test voltages through a specified test impedance into the positive power input terminals of the unit under test. Historically this has been done with either a switching relay, which has the disadvantages of slow actuation and contact bounce, or an isolating transformer in series with the power source, which has the disadvantage of being incapable of handling pulses longer than a few milliseconds. Solid state transistor switches are not a satisfac- tory solution, because transistors with sufficient current and voltages ratings are too slow for microsecond range pulses.