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Method to Integrate Pseudo-Random Pattern Generation

IP.com Disclosure Number: IPCOM000006595D
Publication Date: 2002-Jan-16

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for permitting flexible, deterministic, post-silicon testing of microprocessors. The disclosed method allows rapid stimulation of embedded digital circuits (such as cache memories) with a wide variety of stimulus patterns. With the disclosed method, memory-stimulation functionality can be tied to the performance parameters of the chip under test.