NON-DESTRUCTIVE RF TEST OF SURFACE MOUNT DEVICES BY PROBING
Original Publication Date: 1992-Dec-01
Included in the Prior Art Database: 2002-Jan-18
This publication describes a methodology for per- forming a non-des~ctive/non-abrasive RF test of SMDs (Surface Mount devices) by probing. The method is an inexpensive solution intermediary between manual testing and use of newer, more expensive high speed testers. In either manual testing or high speed automated testers, the product tested is subjected to additional handling operations as the product is delivered from a carrier to the test head and back to the carrier.