THE FAUST AND GOETHE PROGRAMS
Original Publication Date: 1992-Dec-01
Included in the Prior Art Database: 2002-Jan-25
Because of the increasing size and complexity of integrated circuits, fault simulation and automatic test generation are among the most computer intensive tasks associated with integrated circuit design. This paper desctii two computer prwgrams which reduce the num- ber of faults that must be simulated or tested and which also assist in reducing the engineering effort involved in analysis of undetected faults.