Browse Prior Art Database

THE FAUST AND GOETHE PROGRAMS

IP.com Disclosure Number: IPCOM000006717D
Original Publication Date: 1992-Dec-01
Included in the Prior Art Database: 2002-Jan-25

Publishing Venue

Motorola

Related People

Authors:
Donald Horr John Salick

Abstract

Because of the increasing size and complexity of integrated circuits, fault simulation and automatic test generation are among the most computer intensive tasks associated with integrated circuit design. This paper desctii two computer prwgrams which reduce the num- ber of faults that must be simulated or tested and which also assist in reducing the engineering effort involved in analysis of undetected faults.