Novel Termination Structure For Polymer Thick Film Embedded Resistors
Original Publication Date: 2002-Feb-21
Included in the Prior Art Database: 2002-Feb-21
A novel termination structure for screen-printed polymer thick film (PTF) embedded resistors is demonstrated. The number of process steps is equivalent to current practice, but improved linearity of resistor value both as-printed and during environmental stress vs. resistor length is obtained, allowing improved tolerances, especially in resistor ratios. The new termination structure also offers superior resiliency in thermal shock.