BROADBAND CHARACTERIZATION METHOD FOR DIELECTRIC CONSTANT AND LOSS TANGENT
Original Publication Date: 1994-Jun-01
Included in the Prior Art Database: 2002-Mar-04
The electrical properties of materials such as die- lectric constant and loss tangent are needed for the design of RF/Microwave products. The wide band of frequencies in which these products are realized requires a broadband characterization approach. Cur- rent methods used to determine the dielectric con- stant and the loss tangent are based on the resonant properties of cavities and of transmission lines. The resonant approach provides information only at the first resonant frequency and its multiples.