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BROADBAND CHARACTERIZATION METHOD FOR DIELECTRIC CONSTANT AND LOSS TANGENT

IP.com Disclosure Number: IPCOM000007180D
Original Publication Date: 1994-Jun-01
Included in the Prior Art Database: 2002-Mar-04
Document File: 2 page(s) / 98K

Publishing Venue

Motorola

Related People

Authors:
Adolfo C. Reyes

Abstract

The electrical properties of materials such as die- lectric constant and loss tangent are needed for the design of RF/Microwave products. The wide band of frequencies in which these products are realized requires a broadband characterization approach. Cur- rent methods used to determine the dielectric con- stant and the loss tangent are based on the resonant properties of cavities and of transmission lines. The resonant approach provides information only at the first resonant frequency and its multiples.