Browse Prior Art Database

Plane Shift Measurement Method Utilizing Z-Axis Coupled Structures

IP.com Disclosure Number: IPCOM000007810D
Publication Date: 2002-Apr-24

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method that uses broadside impedance structures to accurately measure layer registration and movement in packaging and PCB fabrication. Benefits include the ability to measure plane shift in a non-destructive way.