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Built In Self Test Improvement for Charge Redistribution Analog to Digital Converter Disclosure Number: IPCOM000007828D
Original Publication Date: 2002-Apr-25
Included in the Prior Art Database: 2002-Apr-25

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Al Heiden


A method is described to improve the efficiency of test for the charge redistribution analog to digital converter (ADC). This type of converter was first described in James L. McCreary and Paul R. Gray, "All-MOS Charge Redistribution Analog-to-Digital Conversion Techniques," IEEE Journal of Solid State Circuits, Vol. SC-10, No. 6, December 1975, at pages 371-379 and also U.S. Pat. No. 4,129,863