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A METHODOLOGY TO SIZE POWER BUS WITHIN THE ELECTROMIGRATION AND VOLTAGE DROP CONSTRAINTS

IP.com Disclosure Number: IPCOM000008117D
Original Publication Date: 1997-Jun-01
Included in the Prior Art Database: 2002-May-20
Document File: 2 page(s) / 87K

Publishing Venue

Motorola

Related People

Authors:
Larry Kan Ruey Yu Willie Anderson

Abstract

In IC design, for a given metal line width of a power supply bus, e.g. VCC, the number of circuits allowed to be hooked up or, more specifically its bus length, has its limit. This is because of the lii- tations of both the metal electromigration rules and the tolerable IR drop along the power bus. There often exists the case where one rule dominates the other within any given metal width range. The tradi- tional way to size the power bus is through trial and error and experience. This method provides a straight forward way to optimize the metal width and metal length.