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Method for a DFT technique to minimize the test application time of two pattern tests

IP.com Disclosure Number: IPCOM000008157D
Publication Date: 2002-May-22

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for a design for test (DFT) technique to minimize the test application time of two pattern tests. Benefits include lowered test cost, due to reduced application time and tester data volume, improved test environment and improved reliability.