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Thermal Overstress Fuse

IP.com Disclosure Number: IPCOM000008158D
Publication Date: 2002-May-22

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is an approach that uses a circuit to detect when a thermal diode on a microprocessor reaches a set maximum temperature and blows a low-voltage fuse. Benefits include, by reading the fuses and knowing the maximum temperature during testing or stressing, being able to optimize stress/test temperatures to minimize occurrences of thermal runaway.