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Short Test Time Process Monitor Circuits and the Monitor Data Collection Method in High Volume Manufacturing

IP.com Disclosure Number: IPCOM000008237D
Publication Date: 2002-May-29
Document File: 4 page(s) / 69K

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for collecting process monitor data from every dice in High Value Manufacturing (HVM). Benefits include shorter test times.