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A METHOD FOR SIMULTANEOUS RETENTION AND IDDQ TESTING OF EMBEDDED MEMORIES AND SCAN SEQUENTIAL LOGIC

IP.com Disclosure Number: IPCOM000008450D
Original Publication Date: 1997-Dec-01
Included in the Prior Art Database: 2002-Jun-14

Publishing Venue

Motorola

Related People

Authors:
Matthew Pressly Alfred Crouch

Abstract

Microprocessors commonly contain embedded arrays of memory cells (called memories for the duration of this paper) for caching of instructions or data or for direct use by the customer. They also contain large numbers of individual storage cells, implemented as flip-flops' or latches. These are used throughout the microprocessor for storage of state for state machines, for data and address regis- ters, and for many other uses. The M68060 micro- processor, for example, contains about thirteen thousand flip-flops and 16Kb of cache memory.