MODE- AND CYCLE-DEPENDENT TEST MODE TIMING FOR EMBEDDED MICROCONTROLLERS
Original Publication Date: 1998-Jun-01
Included in the Prior Art Database: 2002-Jul-09
Small S-bit microcontrollers with embedded memory will typically have a number of pins dedi- cated to bringing the address and data bus in and out of the part for testability reasons. To minimize the number of pins required for this non-user function, it is desirable to multiplex as much information as possible onto each pin.