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Method for a highly accurate, scalable, no-touch leakage built-in self-test

IP.com Disclosure Number: IPCOM000009103D
Publication Date: 2002-Aug-07

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for a highly accurate, scalable, no-touch leakage built-in self-test (NTL BIST). Benefits include improved test environment and improved reliability.