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CHARGE PUMP REGULATION FOR FAULT DETECTION IN HIGH VOLTAGE NON-VOLATILE MEMORY CIRCUITS

IP.com Disclosure Number: IPCOM000009141D
Original Publication Date: 1999-Jun-01
Included in the Prior Art Database: 2002-Aug-09

Publishing Venue

Motorola

Related People

Authors:
Christian Dodd Philippe Bauser Steven Donnelly

Abstract

Currently the high voltage circuits in non- volatile memory designs are typically tested by per- forming lengthy program and erase sequences. Even with this technique, usually only gross faults are found as opposed to subtle fails, which do not cause logical 'stuck at' conditions but could later become reliability concerns or early life fails.