IN SITU IC TEST SOCKET
Original Publication Date: 1999-Sep-01
Included in the Prior Art Database: 2002-Aug-22
An interface method is described, which facili- tates the testing of ICs that are packaged on sub- strates with C5 interconnects. The IC contact method is based on a conformable, anisotropic inter- connect, which provides excellent rf characteristics in a frequency range from dc to 3 GHz.