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Browse Prior Art Database

TEST MODE DECODER

IP.com Disclosure Number: IPCOM000009552D
Original Publication Date: 1999-Sep-01
Included in the Prior Art Database: 2002-Sep-02

Publishing Venue

Motorola

Related People

Authors:
Avraham Ganor Yoram Yeivin

Abstract

Integrated circuits (KS) can comprise test cir- cuitry. Usually, a test mode is communicated to the IC by a number a dedicated pins used for testing purpose only. While the functionality of ICs becomes more and more complex, the number of available pins is limited. Testing the IC through test pins is usually required only after manufacturing but not required during normal operation. There is a need to reduce the number of test pins or to provide multi-functional pins.