EMC TEST MODE FOR DIGITAL IC'S
Original Publication Date: 1999-Sep-01
Included in the Prior Art Database: 2002-Sep-03
The use of high speed embedded CPUs and other digital IC's with oscillator's in products causes radiated and conducted emissions of RF energy. Because these parts have many signal lines and the coupling of unwanted signals to the outside world is often complex it is often difficult to determine which of these signals causes a specific emission.