Browse Prior Art Database

EMC TEST MODE FOR DIGITAL IC'S

IP.com Disclosure Number: IPCOM000009564D
Original Publication Date: 1999-Sep-01
Included in the Prior Art Database: 2002-Sep-03

Publishing Venue

Motorola

Related People

Authors:
Chris Dewitt

Abstract

The use of high speed embedded CPUs and other digital IC's with oscillator's in products causes radiated and conducted emissions of RF energy. Because these parts have many signal lines and the coupling of unwanted signals to the outside world is often complex it is often difficult to determine which of these signals causes a specific emission.