DIFFERENTIAL SENSE AMPLIFIER REFERENCE CURRENT MODE FOR PRODUCTION SCREENING
Original Publication Date: 2000-Jan-01
Included in the Prior Art Database: 2002-Sep-05
The use of a highly parallelized logic tester EXISTING SENSE AMPLIFIER SCHEME early in production screening called wafer level burn-in has necessitated an embedded flash memory When reading a flash memory array, a sense test mode where the sense amplifier reference cm- amplifier compares the value of a reference current rent can be changed to a non-bitcell based reference. against the current produced from a flash memory bitcell. Initially, we had a sensing scheme which compared a bitcell based reference current against a bitcell in the flash memory array exclusively.