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SLOW TURN-AROUND IN TEST SYSTEM RECONFIGURATION

IP.com Disclosure Number: IPCOM000009657D
Original Publication Date: 2000-Jan-01
Included in the Prior Art Database: 2002-Sep-09

Publishing Venue

Motorola

Related People

Authors:
Gerard Donnelly

Abstract

The problem I found was in the setting up of test bays, where a number of pieces of test equipment are gathered together and controlled by a PC via a HPIB (interface) card. The equipment used can vary from loads, meters, switches to power supplies etc. When under computer control these pieces of test equipment are connected through a switching device (switch control unit).