SLOW TURN-AROUND IN TEST SYSTEM RECONFIGURATION
Original Publication Date: 2000-Jan-01
Included in the Prior Art Database: 2002-Sep-09
The problem I found was in the setting up of test bays, where a number of pieces of test equipment are gathered together and controlled by a PC via a HPIB (interface) card. The equipment used can vary from loads, meters, switches to power supplies etc. When under computer control these pieces of test equipment are connected through a switching device (switch control unit).