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Flying Height Characterization Below 10 nm Disclosure Number: IPCOM000010444D
Original Publication Date: 2002-Dec-03
Included in the Prior Art Database: 2002-Dec-03
Document File: 1 page(s) / 37K

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Flying Height Characterization Below 10 nm Presented is an alternative method for the characterization of FH when spacings get below 10nm. At these levels the industry is faced with an accuracy problem. Many have tried to address the problem with only some success. New optical techniques have been proposed (and patented). The reduced spacing will only get worse and the system proposed here is a departure from conventional characterization methodology.

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Flying Height Characterization Below 10 nm

Proposed is a controlled roughness disk surface that can be used to determine the FH due to the dynamic response from the head. Flying Height is characterized by the resonant frequency and detection of contact between the head and disk (ie: Acoustic Emission or Thermal Asperity feedback). The characterization can be any one, a combination of external (as with an Acoustic Emission or LDV) sensors, directly from the head read sensor itself or a self contained sensing element.

The disk texture zones can be either radial spokes or circumferential bands. They can be integrated as a part of the CSS zone, tapered or multi-level textures zones. If implemented at the file level, we can monitor it over time to predict concerns about reliability due to FH or clearance change.

Disclosed by International Business Machines Corporation