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Method for an improved heatsink for ATC during testing

IP.com Disclosure Number: IPCOM000011432D
Publication Date: 2003-Feb-19

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for an improved heatsink for active thermal control (ATC) during testing with the objective of minimizing device temperature rise during test. Benefits include improved functionality, improved performance, and an improved test environment.