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Efficient Method For Migrating Test Data From Embedded Macro Pins To Chip Pins

IP.com Disclosure Number: IPCOM000012575D
Original Publication Date: 2003-May-15
Included in the Prior Art Database: 2003-May-15

Publishing Venue

IBM

Abstract

This concept addresses the problem of testing more than two identical embedded macros simultaneously. The number of chip output pins to be measured is limited to 2 times the number of macro output pins to be measured. By measuring just two pins, the corresponding output pin of all embedded macros can be measured.