Efficient Method For Migrating Test Data From Embedded Macro Pins To Chip Pins
Original Publication Date: 2003-May-15
Included in the Prior Art Database: 2003-May-15
This concept addresses the problem of testing more than two identical embedded macros simultaneously. The number of chip output pins to be measured is limited to 2 times the number of macro output pins to be measured. By measuring just two pins, the corresponding output pin of all embedded macros can be measured.