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Method for IC open-joint testing at PCB assembly through emission spot analysis

IP.com Disclosure Number: IPCOM000012705D
Publication Date: 2003-May-21

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for integrated circuit (IC) open-joint testing at printed circuit board (PCB) assembly (PCBA) through emission spot analysis. Benefits include an improved test environment and improved reliability.