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A METHOD OF DETECTING OPEN DEFECTS IN EXTENSION LINES

IP.com Disclosure Number: IPCOM000013343D
Original Publication Date: 2001-Oct-13
Included in the Prior Art Database: 2003-Jun-18

Publishing Venue

IBM

Abstract

Enter the body of your Invention Disclosure Publication below. You may include drawings and highlighting as appropriate. 1. Introduction Nowadays, FPD panels enlarge and consist of fine pixels, so that the time for driving each line tends to be shortened. For this reason, to avoid transient distortion, it is expected that the products driven from both sides increase. However, taking care of costs and time for testing, the voltage is driven only from a single side at array test. Under this condition, there could be misjudgment about open defects that happen on the other and invisible area of driving side. It is not enough for the line, which has this type of defect, to drive voltage only from a single side at the final state of product. How to detect them is described here. 2. Current version of open test