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Half contact array testing method for TFT array

IP.com Disclosure Number: IPCOM000013880D
Original Publication Date: 2000-Apr-01
Included in the Prior Art Database: 2003-Jun-19

Publishing Venue

IBM

Abstract

his article describes a design for testing of TFT arrays in which data lines on a TFT array panel are grouped into odd number data lines and even number data lines and odd or even number data lines are tested at a time. This scheme can reduce investment for testing since the number of contact probes can be halved and test circuits needed for inspection can be reduced. First Step: Probes are brought into contact with odd number data lines. (Figure1) Odd number data lines are connected to the inspection device by probes. Input Voff to PAD1. TFTs on odd number data lines become OFF and odd number data lines are separated from Vhold (GND). Input Von to PAD2. TFTs on even number data lines become ON and even data number data lines are connectd to Vhold.