Method for quantitative parameterization in custom interconnection design
Original Publication Date: 2002-Nov-15
Included in the Prior Art Database: 2003-Jun-20
Self-consistent formalisms are disclosed for intervention with pre-route algorithms in ULSI designs and for quantifying the physical properties of routes prepared with a pre-route algorithm. Disclosed are: (1) New measures of interconnect complexity to characterize individual interconnections and to characterize the set of interconnections in a design layout; and (2) A method for intervention with a pre-route algorithm. The term interconnect complexity refers to the physical characteristics of interconnections in a wire configuration for a design. Measures of interconnect complexity of a wire configuration for all routes in a design include: (1) total excess Steiner length TESL, (2) total excess Manhattan length TEML, (3) Steiner quality Q S , and (4) Manhattan quality Q M . TESL is obtained by subtracting the total Steiner length for all signals from the total netlength for all signals. TEML is obtained by subtracting the total Manhattan length from the total netlength. The Steiner quality Q S is the ratio of the total Steiner length to TESL, and the Manhattan quality Q M is the ratio of the total Manhattan length to TEML.
Measures of the complexity of each individual interconnection include: (1) normalized excess Steiner length NESL; (2) normalized excess Manhattan length NEML; (3) average normalized excess Steiner length