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Method for self-testing high-speed I/O buffers not connected to a tester

IP.com Disclosure Number: IPCOM000016501D
Publication Date: 2003-Jun-25

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for self-testing high-speed input/output (I/O) buffers not connected to a tester. Benefits include an improved test environment, improved test performance, and improved reliability.