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Method and Apparatus for Failure Analysis Using Spare Gates

IP.com Disclosure Number: IPCOM000020680D
Publication Date: 2003-Dec-08

Publishing Venue

The IP.com Prior Art Database

Related People

Inventors:
Zarir Sarkari [+details]

Abstract

The method and apparatus described herein may be used to create a reusable methodology for FIB micro surgery. An access pads cell may be coupled to a native gate in a physical design library to generate a spare gate cell. The spare gate cell may include a ground metal line coupled to inputs of the gate so that the inputs do not float. Multiple spare gate cells may be aggregated into a larger module that is instantiated multiple times into the design layout. The ground metal line may be cut during FIB in order to connect access pads with exposed nodes in the circuit to perform necessary fixes. Both front side and back side FIB may be enabled by using access pads having contact areas on both the highest and lowest metal layers of a die that are connected through vias.