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Method for an AFM or profilometric cantilever with an integrated microanalysis sensor

IP.com Disclosure Number: IPCOM000020727D
Publication Date: 2003-Dec-10

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method for an atomic force microscope (AFM) or profilometric cantilever with an integrated microanalysis sensor. Benefits include improved functionality and improved performance.