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Hardware Concepts Allowing for Actuated LGA Modules to be Test Probed

IP.com Disclosure Number: IPCOM000022072D
Original Publication Date: 2004-Feb-23
Included in the Prior Art Database: 2004-Feb-23

Publishing Venue

IBM

Abstract

The application of Land Grid Array (LGA) vs. more traditional Pin Grid Array (PGA) interconnect technology has created diagnostics difficulties when attempting to analyze logic related failures.Typical hardware designs that apply the required axial force to mate/maintain the interconnect have prevented the ability of test probing near the module assembly. To address this, a special means was developed to facilitate the actuation of the LGA connector (either temporally or permanently), while still allowing for in situ diagnostic probing to be supported.