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Circuit for an Automated On-Die Low Yield Analysis Test Mode of Memory Arrays

IP.com Disclosure Number: IPCOM000022483D
Publication Date: 2004-Mar-17

Publishing Venue

The IP.com Prior Art Database

Abstract

Disclosed is a method to characterize individual SRAM cells in microprocessor memory; it enables individual transistors in memory to be curve-traced at speed, and in parallel, on the die. Benefits include reducing test times and costs, and a measurement technique that can be used on future processes.