Circuit for an Automated On-Die Low Yield Analysis Test Mode of Memory Arrays
Publication Date: 2004-Mar-17
The IP.com Prior Art Database
Disclosed is a method to characterize individual SRAM cells in microprocessor memory; it enables individual transistors in memory to be curve-traced at speed, and in parallel, on the die. Benefits include reducing test times and costs, and a measurement technique that can be used on future processes.