SAMPLE PREPARATION JIG FOR SAMPLE MICROSCOPY
Original Publication Date: 1991-Oct-31
Included in the Prior Art Database: 2004-Apr-05
Xerox Disclosure Journal
The present invention relates to electron microscopy, in particular, an apparatus for preparation of samples to be viewed in an electron microscope. A transmission electron microscope is capable of capturing details of a portion of a sample at the atomic level. In order to do so, however, the region of the sample to be viewed must be on the order of 100 or less in thickness. The sample to be viewed is often in the form of a disk of material which must be appropriately thinned. One common technique for thinning a sample is to place it on a holder and grind it down to the appropriate thickness. A refinement on this technique is to grind it down to a sufficient thickness, then put the sample in an ion mill and actually perforate the sample at one point. The regions of the sample at the immediate circumference of the perforation are of the appropriate thickness for electron microscopy.