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CYCLE-DOWN DARK DECAY AND REST RECOVERY COMPUTATION

IP.com Disclosure Number: IPCOM000027056D
Original Publication Date: 1995-Feb-28
Included in the Prior Art Database: 2004-Apr-07

Publishing Venue

Xerox Disclosure Journal

Abstract

The dark decay potential of an active matrix (AMAT) photoreceptor increases with successive cycles. For a fixed-grid charging method, this results in a lower dark-decay potential (VDDP) before development for each cycle. The term cycle-down is commonly used to describe this phenomenon. A rest period between jobs would allow the AMAT photoreceptor to recover and thereby have a lower dark-decay potential than before the rest period. Traditionally, a rest recovery table is employed to estimate the correction in VDDP after the rest period, and a concurrent process control correction is employed based upon the VDDP error for the previous cycle. Since the rest recovery table is only a function of rest time, lacking historical usage information, there is a potential for large error to arise under differing usage conditions. For example, the after-the-fact correction of process control based upon previous cycle error, and not on anticipated cycle-down, could result in a 1arge.error at the beginning few cycles when the cycle-down value is large for an aged photoreceptor. Accordingly, there is a need for a better VDDP control algorithm.