Processor Thermal Test Fixture
Original Publication Date: 2004-Apr-22
Included in the Prior Art Database: 2004-Apr-22
Disclosed is a device for securing a temperature control device to a microprocessor or ASIC under test. Benefits include consistent and repeatable test results resulting from consistent and coplanar contact between the temperature control device and the device under test (DUT). The disclosed test fixture consists of a toggle clamp with an adjustable spring loaded piston that applies a force down through the temperature control assembly onto the DUT. The downward force secures the temperature control assembly in place and helps create a coplanar junction.