Method to Reduce Chip Hot Spots Using Redundant Macros and Units
Original Publication Date: 2004-Aug-04
Included in the Prior Art Database: 2004-Aug-04
Proposed is the use of redundant functional units and/or circuit macros to reduce thermal hot spots that are caused by the execution of tight computational loops in microprocessors. Reducing such hot spots can reduce thermal cooling and packaging costs while potentially increasing performance.