Browse Prior Art Database

Method of Diagnosing Intermittent Logic Built-In Self Test Pattern Sequence Dependencies Disclosure Number: IPCOM000031167D
Original Publication Date: 2004-Sep-15
Included in the Prior Art Database: 2004-Sep-15

Publishing Venue



The disclosed invention describes a novel method of diagnosing intermittent logic built-in self test (LBIST) signatures in very large scale integration (VLSI) devices that occur in any Nth loop of the first test sequence being executed.