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Multiple LBIST Fails Diagnostic Test Data Acquisition Method

IP.com Disclosure Number: IPCOM000033398D
Original Publication Date: 2004-Dec-09
Included in the Prior Art Database: 2004-Dec-09

Publishing Venue

IBM

Abstract

Disclosed is a method for identifying multiple failing test in an LBIST design utilizing Signature Analysis techniques. The basic concept provides the ability to generate unique and independent signatures for each test cycle. This is achieved by repeatedly enabling system clocks for individual test cycles.