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Capacitor Automated Stress Test

IP.com Disclosure Number: IPCOM000034425D
Original Publication Date: 1989-Feb-01
Included in the Prior Art Database: 2005-Jan-27

Publishing Venue

IBM

Related People

Authors:
Camenga, R Kincart, JP [+details]

Abstract

A majority of electronic device reliability projections are based on data gathered from accelerated stress test programs. The testing system described here accurately determines the time-to-failure of tantalum capacitors. The primary failure mode for tantalum capacitors is one of voltage breakdown resulting in shorts or very low resistance paths appearing across the device. The failure mode in this case is modeled by the Weibel distribution (a log-log plot), and accurate measurement of times to fail are very important. Existing methods for gathering accurate time-to-fail data include, but are not limited to, the following: 1) A strip chart recorder is connected to the device under test (DUT) power supply. (Image Omitted) 2) Lamps connected to the DUTs are photographed by camera.