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Algorithmic Random Pattern Generation Using Deterministic Seeds

IP.com Disclosure Number: IPCOM000034736D
Original Publication Date: 1989-Apr-01
Included in the Prior Art Database: 2005-Jan-27

Publishing Venue

IBM

Related People

Authors:
Waicukauski, J Wu, DM [+details]

Abstract

Disclosed is an algorithmic random pattern generation method which integrates advantages of pseudo random patterns and deterministic patterns. This algorithm reduces test data volume, minimizes test generation time, and provides high test coverage. To gain total control of the number of random patterns, an algorithmic method is adopted to generate Algorithmic Random Patterns (ARPs) using a deterministic pattern as the seed. A cost-effective objective proposed by this method is to use existing test generation and fault simulation tools to achieve goals. The procedure is as follows: Step A: The first step of the ARP generator is to use a deterministic test generator such as PODEM 1, FAN 2 or D-algorithm 3 to generate one (and only one) pattern.