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Reliability Testing Using History and Economics

IP.com Disclosure Number: IPCOM000034738D
Original Publication Date: 1989-Apr-01
Included in the Prior Art Database: 2005-Jan-27

Publishing Venue

IBM

Related People

Authors:
Breyfogle, FW Linton, RL Wheeler, S [+details]

Abstract

A test process is described which employs a technique for obtaining a Bayesian prior utilizing history test data from other products and a technique for utilizing economic considerations when designing a reliability certification test. Tests are often performed to "certify" that a machine/card failure-rate criterion is not exceeded. Classical statistical sample size requirements are getting larger since failure-rate criteria are decreasing with new technologies. This new process reduces test sample size requirements. Bayesian statistical techniques can be used to reduce a test sample size if there is "prior information" about the product failure rate; however, often these tests are performed on new products that have no historical data.