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Variable Voltage From Product Under Test

IP.com Disclosure Number: IPCOM000035260D
Original Publication Date: 1989-Jun-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Beck, DL Egan, PK [+details]

Abstract

During functional stress testing of system logic units in manufacturing test, systems are tested at the high and low voltage limits of the system specification. The need for a low-cost power source with adjustable variable voltage is satisfied by using a special combination of hardware and software. Thus, a low-cost system product regulator card can be used for stress testing.