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Reduced Pattern Set and Related Test Algorithm for Data Path Test

IP.com Disclosure Number: IPCOM000035264D
Original Publication Date: 1989-Jun-01
Included in the Prior Art Database: 2005-Jan-28

Publishing Venue

IBM

Related People

Authors:
Erpeldinger, B [+details]

Abstract

This article describes an efficient algorithm to be used in data path tests like registers, data bus, arrays, etc. It may be useful for people involved in machine architecture, hardware design, test, and diagnostic design.