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Reduced Pattern Set and Related Test Algorithm for Data Path Test Disclosure Number: IPCOM000035264D
Original Publication Date: 1989-Jun-01
Included in the Prior Art Database: 2005-Jan-28

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Erpeldinger, B [+details]


This article describes an efficient algorithm to be used in data path tests like registers, data bus, arrays, etc. It may be useful for people involved in machine architecture, hardware design, test, and diagnostic design.